The Laue spot intensity scales mainly with the grain size, level of disorder and structure factor. The LAUE tool collects a high-resolution X-ray diffraction pattern from the single crystal out of which the right crystallographic plane cut can be selected with excellent accuracy. To match real collected Laue patterns (finite recording exposure time, high-energy cut-off of incoming polychromatic beam), the synthetic Laue patterns have been partly modified and filtered. A well-collimated, circular, x-ray beam is necessary as well. The crystal’s quality, its thickness, and its composition also play roles in determining the Laue pattern’s clarity. Single crystals' electro-optical properties are strongly dependent on crystallographic orientations. A virgin or cleaved surface usually produces a good pattern, but in many cases, the surface needs to be prepared by sanding with very fine sandpaper or polishing. The system delivers an intense X-ray beam with less than 0.3mm on the sample. If polychromatic x-rays derived from a synchrotron radiation spectrum are used, they generate a Laue diffraction pattern. An applet to calculate the Fourrier Transform of a density function (x) yielding the complex magnitude G(S). With dedicated software, the orientation of single crystals can be measured quickly with excellent accuracy In particular, Laue patterns, Debye Scherrer diagrams, rotating crystals and even precession photographs can be generated. A high-resolution Crystal Orientation System is the ideal tool to capture and analyse the Laue diffraction pattern from a wide range of crystalline materials. Candler 3,9, and J.Single-crystal materials are playing an important role in novel devices, from non-linear optics to jet engine turbine blades and superconducting materials. In other words, each diffraction spot is an X-ray topogram. LaueNN- neural network training and prediction routine to index single and polycrystalline Laue diffraction patterns. This work reveals the critical role of the interplay between twin walls and dislocations within a ferroelectric substrate in the performance of multiferroic heterostructures and provides insight into the development of highly energy-efficient magnetoelectric devices. In fact, if the diffracted X-rays are recorded on the detector, each diffraction spot on the resulting Laue pattern represents a map of the scattering ability of a certain set of reflecting planes depending on their position in the crystal. A large fraction of this uniaxial strain is transferred to the magnetoelastically coupled ferromagnetic layers whose magnetization switches to in plane via the inverse magnetostriction effect. On the other hand, the ferroelectric polarization reorients from to direction in a dislocation-free BaTiO 3, inducing the maximum achievable in-plane compressive strain of 1.1%. This, in turn, results in a modest reduction of the PMA of the ferromagnetic layer. A dense twinned structure in conjunction with a high dislocation density significantly reduces the converse piezoelectric effect of BaTiO 3 by hindering the propagation of newly nucleated domains with an applied electric field. ![]() We investigate the influence of dislocations and twin walls in BaTiO 3 on its ferroelectric response and the resulting effect on the perpendicular magnetic anisotropy (PMA) of a strain-coupled n film.
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